{"title":"高功率超宽带和振荡器源受害者实验","authors":"D. Åberg, F. Olsson, M. Jansson, C. Lindskog","doi":"10.1109/EMCEUROPE.2008.4786910","DOIUrl":null,"url":null,"abstract":"This paper presents effects of high power microwave sources on packaged IC circuits. The sources were one UWB system and one narrow band system consisting of a vircator. The paper reports threshold of susceptibilities for the two different sources on victims which were elementary logic circuits of bipolar and MOS-technologies.","PeriodicalId":133902,"journal":{"name":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High power ultra wide band and vircator source-victim experiments\",\"authors\":\"D. Åberg, F. Olsson, M. Jansson, C. Lindskog\",\"doi\":\"10.1109/EMCEUROPE.2008.4786910\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents effects of high power microwave sources on packaged IC circuits. The sources were one UWB system and one narrow band system consisting of a vircator. The paper reports threshold of susceptibilities for the two different sources on victims which were elementary logic circuits of bipolar and MOS-technologies.\",\"PeriodicalId\":133902,\"journal\":{\"name\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE.2008.4786910\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2008.4786910","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High power ultra wide band and vircator source-victim experiments
This paper presents effects of high power microwave sources on packaged IC circuits. The sources were one UWB system and one narrow band system consisting of a vircator. The paper reports threshold of susceptibilities for the two different sources on victims which were elementary logic circuits of bipolar and MOS-technologies.
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