{"title":"从集成电路近场确定器件的发射","authors":"G. Langer, Jörg Hacker","doi":"10.1109/EMCCompo.2019.8919685","DOIUrl":null,"url":null,"abstract":"EMC parameters of complex ICs are unknown. Therefore the simulation of the emission of electronic devices is challenging. The article introduces a method to describe ICs by an equivalent current. It is explained how this current can be determined metrological and used for a calculation of the far field. Any IC can be characterized by an equivalent current. Hence, the equivalent current can be used as a global IC EMC parameter.","PeriodicalId":252700,"journal":{"name":"2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Determining the Emission of a Device from the Near Field of an IC\",\"authors\":\"G. Langer, Jörg Hacker\",\"doi\":\"10.1109/EMCCompo.2019.8919685\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"EMC parameters of complex ICs are unknown. Therefore the simulation of the emission of electronic devices is challenging. The article introduces a method to describe ICs by an equivalent current. It is explained how this current can be determined metrological and used for a calculation of the far field. Any IC can be characterized by an equivalent current. Hence, the equivalent current can be used as a global IC EMC parameter.\",\"PeriodicalId\":252700,\"journal\":{\"name\":\"2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCompo.2019.8919685\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCompo.2019.8919685","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Determining the Emission of a Device from the Near Field of an IC
EMC parameters of complex ICs are unknown. Therefore the simulation of the emission of electronic devices is challenging. The article introduces a method to describe ICs by an equivalent current. It is explained how this current can be determined metrological and used for a calculation of the far field. Any IC can be characterized by an equivalent current. Hence, the equivalent current can be used as a global IC EMC parameter.