A. Deyine, K. Sanchez, P. Perdu, F. Bourcier, F. Battistella, F. Bereil, P. Le Nouy, D. Lewis, H. Deslandes
{"title":"全动态激光模拟设置","authors":"A. Deyine, K. Sanchez, P. Perdu, F. Bourcier, F. Battistella, F. Bereil, P. Le Nouy, D. Lewis, H. Deslandes","doi":"10.1109/IPFA.2009.5232665","DOIUrl":null,"url":null,"abstract":"Laser Stimulation techniques are continuously developed in accordance with the apparition of new kind of defect. We propose the Full Dynamic La-ser Stimulation where the test is fully embedded in the localization process. By using a modulated laser instead of a continuous one we discriminate vectors fail in ad-dition to localization.","PeriodicalId":210619,"journal":{"name":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Full Dynamic Laser simulation set up\",\"authors\":\"A. Deyine, K. Sanchez, P. Perdu, F. Bourcier, F. Battistella, F. Bereil, P. Le Nouy, D. Lewis, H. Deslandes\",\"doi\":\"10.1109/IPFA.2009.5232665\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Laser Stimulation techniques are continuously developed in accordance with the apparition of new kind of defect. We propose the Full Dynamic La-ser Stimulation where the test is fully embedded in the localization process. By using a modulated laser instead of a continuous one we discriminate vectors fail in ad-dition to localization.\",\"PeriodicalId\":210619,\"journal\":{\"name\":\"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2009.5232665\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2009.5232665","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Laser Stimulation techniques are continuously developed in accordance with the apparition of new kind of defect. We propose the Full Dynamic La-ser Stimulation where the test is fully embedded in the localization process. By using a modulated laser instead of a continuous one we discriminate vectors fail in ad-dition to localization.
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