{"title":"用于DC/DC变换器应用的高密度超低R/sub / 30伏n沟道场效应管","authors":"R. Sodhi, R. Malik, D. Asselanis, D. Kinzer","doi":"10.1109/ISPSD.1999.764123","DOIUrl":null,"url":null,"abstract":"This paper presents a new high-density trench MOSFET design with ultra-low R/sub dson/ for DC/DC converter applications. A benchmark low specific on-resistance of 26 m/spl Omega/.mm/sup 2/ at 4.5 V gate bias is reported. A remote contact feature is utilized to obtain such high channel density and corresponding channel conductance. In-circuit efficiency as high as 89% is obtained, which is the best obtained in the industry to date.","PeriodicalId":352185,"journal":{"name":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"High-density ultra-low R/sub dson/ 30 volt N-channel trench FETs for DC/DC converter applications\",\"authors\":\"R. Sodhi, R. Malik, D. Asselanis, D. Kinzer\",\"doi\":\"10.1109/ISPSD.1999.764123\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new high-density trench MOSFET design with ultra-low R/sub dson/ for DC/DC converter applications. A benchmark low specific on-resistance of 26 m/spl Omega/.mm/sup 2/ at 4.5 V gate bias is reported. A remote contact feature is utilized to obtain such high channel density and corresponding channel conductance. In-circuit efficiency as high as 89% is obtained, which is the best obtained in the industry to date.\",\"PeriodicalId\":352185,\"journal\":{\"name\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1999.764123\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1999.764123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High-density ultra-low R/sub dson/ 30 volt N-channel trench FETs for DC/DC converter applications
This paper presents a new high-density trench MOSFET design with ultra-low R/sub dson/ for DC/DC converter applications. A benchmark low specific on-resistance of 26 m/spl Omega/.mm/sup 2/ at 4.5 V gate bias is reported. A remote contact feature is utilized to obtain such high channel density and corresponding channel conductance. In-circuit efficiency as high as 89% is obtained, which is the best obtained in the industry to date.