存储荧光粉成像板探测量子效率:蒙特卡罗研究与实验结果

Digest of Technical Papers. PPC-2003. 14th IEEE International Pulsed Power Conference (IEEE Cat. No.03CH37472) Pub Date : 2003-06-15 DOI:10.1109/PPC.2003.1277666

G. Barnea

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引用次数: 3

摘要

通常通过检测量子效率(DQE)来评估x射线成像探测器的性能，DQE衡量探测器保留入射x射线流中包含的图像信息的能力。DQE也是用于比较各种射线照相机和实验装置性能的价值值的重要因素。导出了存储-荧光粉成像板(SPIP)的DQE的简单表达式，并将其计算为入射x射线能量的函数。结果与SPIP暴露于Co/sup 60/ γ辐射下获得的测量数据进行了比较。得到了与理论非常吻合的结果。

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Detective quantum efficiency of a storage phosphor imaging plate: Monte Carlo study and experimental results

The performance of an X-ray imaging detector is generally evaluated by considering its detective quantum efficiency (DQE), which measures the ability of the detector to preserve the image information contained in the incident X-ray fluence. The DQE is also an important factor in figures-of-merit used to compare the performance of various radiographic machines and experimental setups. A simple expression is derived for the DQE of a storage-phosphor imaging plate (SPIP) and it is calculated as a function of the incident X-ray energy. The results are compared with measured data acquired from exposing the SPIP to Co/sup 60/ gamma radiation. An excellent agreement with theory is obtained.

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Digest of Technical Papers. PPC-2003. 14th IEEE International Pulsed Power Conference (IEEE Cat. No.03CH37472)

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