微机械元件面内位移光学测量标定标准的研制

J. Gaspar, J. Held, G. Pedrini, W. Osten, O. Paul
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引用次数: 10

摘要

这项工作的目标是为MEMS生产和表征中使用的光学系统的校准提供平面位移光学测量的小型化参考标准。提出的器件由基于soi的平面微致动器组成。通过频闪照明、激光偏转法和数字散斑干涉测量等光学技术测量了机械和静电驱动引起的位移。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of Calibration Standards for the Optical Measurement of In-Plane Displacements of Micromechanical Components
The goal of this work is to develop miniaturized reference standards for the optical measurement of inplane displacements serving for the calibration of optical systems used in the production and characterization of MEMS. The proposed devices consist of SOI-based inplane microactuators. The displacements resulting from both mechanical and electrostatic actuations are measured by means of optical techniques such as stroboscopic illumination, laser-deflection method and digital speckle interferometry.
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