集成电容平面模型的验证

Yuan-liang Li, D. Figueroa, T. Yew, C. Chung
{"title":"集成电容平面模型的验证","authors":"Yuan-liang Li, D. Figueroa, T. Yew, C. Chung","doi":"10.1109/EPEP.1999.819207","DOIUrl":null,"url":null,"abstract":"As clock speeds increase into the GHz regime and rise times decrease into the picosecond regime, the interaction between capacitors and the power/ground planes of the package, interposer, or board on which they are mounted becomes vitally important to the performance of a power delivery system. To include the interaction, this paper provides an integrated model for a discrete capacitor mounted on pads over vias connected to power/ground planes with degassing holes. The mutual inductance between capacitor pads, vias, and power/ground planes are completely modeled. Our modeling results show that the mutual inductance drastically changes the total loop inductance as compared to the self inductance of the capacitor. In some cases, it even reduces the total effective loop inductance. To validate the integrated modeling method, a test package is built. A measurement technique is introduced to evaluate the total loop inductance of the test package with various capacitors. The predicted results matched very well with measured data which give a high confidence on this predicting model and demonstrate the importance of modeling the interaction between capacitors, vias, and planes.","PeriodicalId":299335,"journal":{"name":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Validation of integrated capacitor-via-planes model\",\"authors\":\"Yuan-liang Li, D. Figueroa, T. Yew, C. Chung\",\"doi\":\"10.1109/EPEP.1999.819207\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As clock speeds increase into the GHz regime and rise times decrease into the picosecond regime, the interaction between capacitors and the power/ground planes of the package, interposer, or board on which they are mounted becomes vitally important to the performance of a power delivery system. To include the interaction, this paper provides an integrated model for a discrete capacitor mounted on pads over vias connected to power/ground planes with degassing holes. The mutual inductance between capacitor pads, vias, and power/ground planes are completely modeled. Our modeling results show that the mutual inductance drastically changes the total loop inductance as compared to the self inductance of the capacitor. In some cases, it even reduces the total effective loop inductance. To validate the integrated modeling method, a test package is built. A measurement technique is introduced to evaluate the total loop inductance of the test package with various capacitors. The predicted results matched very well with measured data which give a high confidence on this predicting model and demonstrate the importance of modeling the interaction between capacitors, vias, and planes.\",\"PeriodicalId\":299335,\"journal\":{\"name\":\"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.1999.819207\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1999.819207","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

随着时钟速度增加到GHz频段,上升时间减少到皮秒频段,电容器与封装、中间层或电路板的电源/地平面之间的相互作用对电力传输系统的性能变得至关重要。为了包括相互作用,本文提供了一个集成模型,用于安装在与带脱气孔的电源/地平面相连的过孔上的焊盘上的离散电容器。电容衬垫、过孔和电源/地平面之间的互感完全建模。我们的建模结果表明,与电容器的自感相比,互感极大地改变了回路的总电感。在某些情况下,它甚至降低了总有效环路电感。为了验证集成建模方法,构建了一个测试包。介绍了一种测量各种电容测试封装回路总电感的方法。预测结果与实测数据非常吻合,这为该预测模型提供了很高的置信度,并证明了对电容器、过孔和面之间的相互作用进行建模的重要性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Validation of integrated capacitor-via-planes model
As clock speeds increase into the GHz regime and rise times decrease into the picosecond regime, the interaction between capacitors and the power/ground planes of the package, interposer, or board on which they are mounted becomes vitally important to the performance of a power delivery system. To include the interaction, this paper provides an integrated model for a discrete capacitor mounted on pads over vias connected to power/ground planes with degassing holes. The mutual inductance between capacitor pads, vias, and power/ground planes are completely modeled. Our modeling results show that the mutual inductance drastically changes the total loop inductance as compared to the self inductance of the capacitor. In some cases, it even reduces the total effective loop inductance. To validate the integrated modeling method, a test package is built. A measurement technique is introduced to evaluate the total loop inductance of the test package with various capacitors. The predicted results matched very well with measured data which give a high confidence on this predicting model and demonstrate the importance of modeling the interaction between capacitors, vias, and planes.
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