x系列方法实现高密度128K和高速32K eprom

D. Guterman, J. Klaas, G. Armstrong, J. Neal, D. McElroy, P. Reed, W. Richardson, H. Stiegler, I. Rimawi
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引用次数: 1

摘要

当前一代eprom有几个严重的限制,这些限制将它们限制在低速和中等尺寸的设备上。为了显著提高EPROM密度和性能,目前的障碍,包括低FAMOS驱动能力和相对较大的单元配置,已经通过多管齐下的攻击来解决;Xscries方法。单元阵列已经重新配置,结合缩放,提供了显着更高密度的内存。FAMOS的性能通过扩展和工艺创新得到了改善,在不显著降低可编程性的情况下实现了更高的单元驱动。电路方法利用更新的存储器结构和性能,以提供更高的EPROM速度已被采用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
X-series approach to high density 128K and high speed 32K EPROMs
PRESENT GENERATION EPROMs have several serious limitations which restrict them to devices of low speed and moderate size'. To improve significantly EPROM density and performance, the present barriers, which include low FAMOS drive capabilities and relatively large cell configurations, have been addressed in this effort through a multipronged attack; the Xscries approach. The cell array has been reconfigured which, in combination with scaling, offers a memory of significantly higher density. The FAMOS performance has been improved through scaling and process innovation, resulting in higher cell drive without significant reduction in programmability. Circuit approaches taking advantage of updated memory architecture and performance to provide higher EPROM speeds have been adopted.
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