{"title":"一种模拟/数字混合ASICS测试策略","authors":"P. Valdenaire, C. Gauthron","doi":"10.1109/EASIC.1990.207958","DOIUrl":null,"url":null,"abstract":"Typical examples of analog functions and their testing are described. It is shown, that these tests can be performed on digital testers. A test strategy for mixed ASICs is proposed, as an extension of techniques applicable to digital ASICs.<<ETX>>","PeriodicalId":205695,"journal":{"name":"[Proceedings] EURO ASIC `90","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A test strategy for mixed analog/digital ASICS\",\"authors\":\"P. Valdenaire, C. Gauthron\",\"doi\":\"10.1109/EASIC.1990.207958\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Typical examples of analog functions and their testing are described. It is shown, that these tests can be performed on digital testers. A test strategy for mixed ASICs is proposed, as an extension of techniques applicable to digital ASICs.<<ETX>>\",\"PeriodicalId\":205695,\"journal\":{\"name\":\"[Proceedings] EURO ASIC `90\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[Proceedings] EURO ASIC `90\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EASIC.1990.207958\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] EURO ASIC `90","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EASIC.1990.207958","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Typical examples of analog functions and their testing are described. It is shown, that these tests can be performed on digital testers. A test strategy for mixed ASICs is proposed, as an extension of techniques applicable to digital ASICs.<>
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