采用深沟槽隔离工艺的600V级反向阻断IGBT超小隔离区(TI-RB-IGBT)

N. Tokuda, M. Kaneda, T. Minato
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引用次数: 25

摘要

我们开发了一种600 V级沟槽隔离RB-IGBT (TI-RB-IGBT),与扩散隔离或硅台面蚀刻等其他隔离技术相比,其终端面积极小。TI面积不仅非常小,而且几乎相同的所有阻断电压等级。我们制造的100 A级TI-RB-IGBT,采用一微米规则平面栅极结构,在两个方向上都具有超过600 V的阻断能力,其正向压降Vce(sat)和关断能量损失Eoff之间的权衡关系略好于我们之前的第三代平面门控IGBT,尽管它具有n型体和后侧集电极结构为NPT型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An ultra-small isolation area for 600V class reverse blocking IGBT with deep trench isolation process (TI-RB-IGBT)
We developed a 600 V class trench isolation RB-IGBT (TI-RB-IGBT), whose termination area is extremely small in comparison with other isolation techniques, such as diffusion isolation or silicon mesa etching. The TI area is not only very small but also almost identical for all the blocking voltage classes. Our fabricated 100 A class TI-RB-IGBT, with one micron rule planar gate structure, has more than 600 V blocking capability for both directions, and its trade-off relationship between the forward voltage drop Vce(sat) and the turn-off energy loss Eoff is slightly better than our previous punch through (PT) type third generation planar gated IGBT, even though it has an n-body and the backside collector structure is of the NPT type.
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