T. Ogura, A. Nakagawa, M. Atsuta, Y. Kamei, K. Takigami
{"title":"采用埋门结构的高频6000v栅极GTOs","authors":"T. Ogura, A. Nakagawa, M. Atsuta, Y. Kamei, K. Takigami","doi":"10.1109/ISPSD.1990.991092","DOIUrl":null,"url":null,"abstract":"A new double gate GTO with buried gate structure for a second gate has been proposed to realize high turn-off gain simultaneously with low turn-off switching loss. The double gate GTO has been combined with an n-buffer structure to realize 6000 V forward blocking voltage with a narrow n-base width, such as 550 p . The high turn-off gain, such as 6, was obtained when the anode current was 500 A . It was found that the double gate GTOs with buried gate realize a very short tail time and a small tail current. The newly developed double gate GTOs decrease the turn-off loss to less than 1/10 of that for the conventional single gate GTOs.","PeriodicalId":162198,"journal":{"name":"Proceedings of the 2nd International Symposium on Power Semiconductor Devices and Ics. ISPSD '90.","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High frequency 6000 V gate GTOs with buried gate structure\",\"authors\":\"T. Ogura, A. Nakagawa, M. Atsuta, Y. Kamei, K. Takigami\",\"doi\":\"10.1109/ISPSD.1990.991092\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new double gate GTO with buried gate structure for a second gate has been proposed to realize high turn-off gain simultaneously with low turn-off switching loss. The double gate GTO has been combined with an n-buffer structure to realize 6000 V forward blocking voltage with a narrow n-base width, such as 550 p . The high turn-off gain, such as 6, was obtained when the anode current was 500 A . It was found that the double gate GTOs with buried gate realize a very short tail time and a small tail current. The newly developed double gate GTOs decrease the turn-off loss to less than 1/10 of that for the conventional single gate GTOs.\",\"PeriodicalId\":162198,\"journal\":{\"name\":\"Proceedings of the 2nd International Symposium on Power Semiconductor Devices and Ics. ISPSD '90.\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-04-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2nd International Symposium on Power Semiconductor Devices and Ics. ISPSD '90.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1990.991092\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2nd International Symposium on Power Semiconductor Devices and Ics. ISPSD '90.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1990.991092","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High frequency 6000 V gate GTOs with buried gate structure
A new double gate GTO with buried gate structure for a second gate has been proposed to realize high turn-off gain simultaneously with low turn-off switching loss. The double gate GTO has been combined with an n-buffer structure to realize 6000 V forward blocking voltage with a narrow n-base width, such as 550 p . The high turn-off gain, such as 6, was obtained when the anode current was 500 A . It was found that the double gate GTOs with buried gate realize a very short tail time and a small tail current. The newly developed double gate GTOs decrease the turn-off loss to less than 1/10 of that for the conventional single gate GTOs.