采用埋门结构的高频6000v栅极GTOs

T. Ogura, A. Nakagawa, M. Atsuta, Y. Kamei, K. Takigami
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引用次数: 0

摘要

提出了一种新的双栅极GTO,其第二栅极采用埋门结构,可以在实现高关断增益的同时实现低关断开关损耗。双栅GTO与n-缓冲结构相结合,实现了以窄n基宽度(如550 p)实现6000v正向阻断电压。当阳极电流为500a时,可获得高关断增益,如6。研究发现,埋栅双栅GTOs的尾时间很短,尾电流很小。新开发的双栅GTOs将关断损耗降低到传统单栅GTOs的1/10以下。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High frequency 6000 V gate GTOs with buried gate structure
A new double gate GTO with buried gate structure for a second gate has been proposed to realize high turn-off gain simultaneously with low turn-off switching loss. The double gate GTO has been combined with an n-buffer structure to realize 6000 V forward blocking voltage with a narrow n-base width, such as 550 p . The high turn-off gain, such as 6, was obtained when the anode current was 500 A . It was found that the double gate GTOs with buried gate realize a very short tail time and a small tail current. The newly developed double gate GTOs decrease the turn-off loss to less than 1/10 of that for the conventional single gate GTOs.
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