{"title":"塑料包装热湿破坏的有限元分析","authors":"N. Sun, D. Lin, Daoguo Yang","doi":"10.1109/EPTC.2003.1298765","DOIUrl":null,"url":null,"abstract":"This paper focuses on ways to analysis the hygro-thermal induced failure mechanism with finite element simulations. The objective is how to evaluate the vapor pressure through the moisture concentration. To predict the position where the failure would happen, a modified Gurson's model is induced and is expanded to represent the contribution of the vapor pressure.","PeriodicalId":201404,"journal":{"name":"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Finite element analysis of hygro-thermal induced failure in plastic packages\",\"authors\":\"N. Sun, D. Lin, Daoguo Yang\",\"doi\":\"10.1109/EPTC.2003.1298765\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper focuses on ways to analysis the hygro-thermal induced failure mechanism with finite element simulations. The objective is how to evaluate the vapor pressure through the moisture concentration. To predict the position where the failure would happen, a modified Gurson's model is induced and is expanded to represent the contribution of the vapor pressure.\",\"PeriodicalId\":201404,\"journal\":{\"name\":\"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2003.1298765\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2003.1298765","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Finite element analysis of hygro-thermal induced failure in plastic packages
This paper focuses on ways to analysis the hygro-thermal induced failure mechanism with finite element simulations. The objective is how to evaluate the vapor pressure through the moisture concentration. To predict the position where the failure would happen, a modified Gurson's model is induced and is expanded to represent the contribution of the vapor pressure.