{"title":"基于监督学习的锁定热成像热点检测与分类图像模式识别研究进展","authors":"K. K. Thinn, Teh Tict Eng, Ming Xue, Rui Zhen Tan","doi":"10.31399/asm.edfa.2023-3.p004","DOIUrl":null,"url":null,"abstract":"\n Lock-in thermography (LIT) is a widely used nondestructive tool for detecting the failure location in integrated circuits. The image pattern recognition algorithm for detecting LIT hotspots benefits image processing and can be leveraged to automate failure analysis processes.","PeriodicalId":431761,"journal":{"name":"EDFA Technical Articles","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Advancements in Image Pattern Recognition for Lock-In Thermography Hotspot Detection and Classification with Supervised Learning\",\"authors\":\"K. K. Thinn, Teh Tict Eng, Ming Xue, Rui Zhen Tan\",\"doi\":\"10.31399/asm.edfa.2023-3.p004\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n Lock-in thermography (LIT) is a widely used nondestructive tool for detecting the failure location in integrated circuits. The image pattern recognition algorithm for detecting LIT hotspots benefits image processing and can be leveraged to automate failure analysis processes.\",\"PeriodicalId\":431761,\"journal\":{\"name\":\"EDFA Technical Articles\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"EDFA Technical Articles\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.edfa.2023-3.p004\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"EDFA Technical Articles","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.edfa.2023-3.p004","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Advancements in Image Pattern Recognition for Lock-In Thermography Hotspot Detection and Classification with Supervised Learning
Lock-in thermography (LIT) is a widely used nondestructive tool for detecting the failure location in integrated circuits. The image pattern recognition algorithm for detecting LIT hotspots benefits image processing and can be leveraged to automate failure analysis processes.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
