{"title":"原子-分子化学组装“纳米多孔二氧化硅-二氧化钛”组合物多孔表面的平面化","authors":"V. Luchinin, M. Panov, A. A. Romanov","doi":"10.1109/BALD.2016.7886522","DOIUrl":null,"url":null,"abstract":"The surface planarization of nanoporous SiO2 is made by method of atomic-molecular layer deposition of TiO2 nanofilm in different modes. A penetration of TiO2 in nano-pores of SiO2 is controlled by ellipsometry.","PeriodicalId":328869,"journal":{"name":"2016 14th International Baltic Conference on Atomic Layer Deposition (BALD)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Planarization of the porous surface of composition “nanoporous silicon dioxide - titanium dioxide” by atomic-molecular chemical assembly\",\"authors\":\"V. Luchinin, M. Panov, A. A. Romanov\",\"doi\":\"10.1109/BALD.2016.7886522\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The surface planarization of nanoporous SiO2 is made by method of atomic-molecular layer deposition of TiO2 nanofilm in different modes. A penetration of TiO2 in nano-pores of SiO2 is controlled by ellipsometry.\",\"PeriodicalId\":328869,\"journal\":{\"name\":\"2016 14th International Baltic Conference on Atomic Layer Deposition (BALD)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 14th International Baltic Conference on Atomic Layer Deposition (BALD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BALD.2016.7886522\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 14th International Baltic Conference on Atomic Layer Deposition (BALD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BALD.2016.7886522","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Planarization of the porous surface of composition “nanoporous silicon dioxide - titanium dioxide” by atomic-molecular chemical assembly
The surface planarization of nanoporous SiO2 is made by method of atomic-molecular layer deposition of TiO2 nanofilm in different modes. A penetration of TiO2 in nano-pores of SiO2 is controlled by ellipsometry.