制备纳米通道膜的多孔硅表面MBE和氧化的蒙特卡罗模拟

Ya. V. Titovskaya, N. Shwartz, S. I. Romanov, Z. Yanovitskaja
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引用次数: 0

摘要

通过分子束外延在纳米通道表面的蒙特卡罗模拟,证明了将纳米通道直径减小到1纳米的可能性。对多孔Si(111)衬底的原子过程进行了研究。在较宽的沉积参数范围内,纳米通道入口尺寸减小的速率估计为0.13 ~ 0.15 nm/ML。确定了膜表面硅沉积的最佳条件:衬底温度为520 ~ 700 K,硅通量强度为10−2−10 ML/s。对纳米通道膜在氧通量下氧化的模拟结果表明,由于氧化而减小通道入口尺寸的影响不显著。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Monte Carlo simulation of MBE and oxidation of porous silicon surface for production nanochannel membranes
Possibility to decrease nanochannel diameters up to one nanometer was demonstrated by Monte Carlo simulation of molecular beam epitaxy on nanochannel surface with following thermal oxidation. Study of atomic processes on porous Si(111) substrates was carried out. In wide range of deposition parameters the rate of nanochannel inlet size decrease was estimated to be 0.13 – 0.15 nm/ML. Optimal conditions for silicon deposition on membrane surface were determined: substrate temperature - from 520 to 700 K, and silicon flux intensity of 10−2 − 10 ML/s. Simulation of nanochannel membranes oxidation in oxygen flux revealed that effect of channel inlet size decreasing due oxidation was insignificant.
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