1/f噪声角建模

Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Pub Date : 2006-06-22 DOI:10.1109/MIXDES.2006.1706551

W.C. Pflanzi, E. Seebacher, Z. Huszka

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引用次数: 1

摘要

本文提出了一种基于统计测量数据的1/f噪声最坏情况(WC)精确生成方法。这是在现有的艺术设计模拟器与CMOS缩放闪烁噪声模型中实现的。在噪声敏感模拟电路上进行了验证，作为鲁棒闪烁噪声设计的基准。所提出的方法可以很容易地扩展到其他设备，如bjt或任何其他设备

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1/f noise corner modeling

This paper presents a new accurate method for generation of 1/f noise worst cases (WC) based on statistical measurement data. This is implemented in existing state of the art design simulators with a scaled flicker noise model for CMOS. Verification is shown on a noise sensitive analog circuitry as a benchmark for robust flicker noise design. The methodology presented can easily be extended to other devices like BJTs or any other

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Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.

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