{"title":"铜互连技术——BEOL制造的新范式","authors":"K. Rose, R. Mangaser","doi":"10.1109/ASMC.1998.731586","DOIUrl":null,"url":null,"abstract":"The advent of copper as a commercial interconnect process means radical changes in back-end-of-line (BEOL) manufacturing. We examine the future of BEOL manufacturing guided by the 1997 National Technology Roadmap for Semiconductors. Changing to copper and future BEOL yield trends are emphasized.","PeriodicalId":290016,"journal":{"name":"IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Copper interconnect technology-new paradigms for BEOL manufacturing\",\"authors\":\"K. Rose, R. Mangaser\",\"doi\":\"10.1109/ASMC.1998.731586\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The advent of copper as a commercial interconnect process means radical changes in back-end-of-line (BEOL) manufacturing. We examine the future of BEOL manufacturing guided by the 1997 National Technology Roadmap for Semiconductors. Changing to copper and future BEOL yield trends are emphasized.\",\"PeriodicalId\":290016,\"journal\":{\"name\":\"IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-09-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.1998.731586\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1998.731586","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Copper interconnect technology-new paradigms for BEOL manufacturing
The advent of copper as a commercial interconnect process means radical changes in back-end-of-line (BEOL) manufacturing. We examine the future of BEOL manufacturing guided by the 1997 National Technology Roadmap for Semiconductors. Changing to copper and future BEOL yield trends are emphasized.