辐照对霍尔探头灵敏度的影响

B. Kulke, R. Frye, F. Penko
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引用次数: 2

摘要

来自两家不同制造商的四个霍尔探针在高级测试加速器上暴露于越来越多的辐射中,并定期与磁场值为2至8 kG的核磁共振(NMR)高斯计进行比较。辐射主要来自45兆电子伏电子束的轫致辐射。探测器被安装在束流转储附近,与LiF热释光探测器一起跟踪累积剂量。数据显示,阈值接近100 kRd,超过该阈值,探头往往会失去灵敏度,并超出其标称误差限制。据推测,灵敏度的损失可能是由γ -n反应中产生的中子引起的InAs霍尔芯片中的晶体位错引起的。据观察,辐射效应不是单调的累积剂量,在某些情况下似乎在较高剂量下消失;这是由于在连续辐照期间或在连续辐照之间探针材料的退火。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effects of irradiation on Hall probe sensitivity
Four Hall probes from two different manufacturers were exposed to increasing amounts of radiation at the Advanced Test Accelerator and were compared periodically to a nuclear magnetic resonance (NMR) gaussmeter at magnetic field values of 2 to 8 kG. The radiation was primarily bremsstrahlung from a 45-MeV electron beam. The probes were mounted near a beam dump, along with LiF thermoluminescent detectors to keep track of the cumulative dose. The data show a threshold near 100 kRd, beyond which the probes tend to lose sensitivity and perform outside their nominal error limits. It is conjectured that the loss in sensitivity may be caused by crystal dislocations in the InAs Hall chip arising from neutrons generated in gamma-n reactions. It is observed that the radiation effects are not monotonic with cumulative dose, and in some cases appear to go away at the higher doses; this is attributed to annealing of the probe material during or in between the successive irradiations.<>
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