用于MCM-D/倒装芯片技术的集成电路分区问题

S. Banerjia, A. Glaser, Christoforos Harvatis, S. Lipa, R. Pomerleau, T. Schaffer, A. Stanaski, Y. Tekmen, G. Bilbro, P. Franzon
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引用次数: 13

摘要

为了成功地将高性能大型单片芯片分割到MCM-D/倒装芯片焊接碰撞技术上,必须解决一些关键问题。这些包括以下内容:(1)在使用内跨芯片边界划分单个时钟周期路径;(2)使用现成记忆的能力;(3)使用MCM进行电源、接地和时钟分配;(4)测试成本管理。本文以CPU为例,对这些问题进行了讨论,并推测了分区产生的一些有趣的可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Issues in partitioning integrated circuits for MCM-D/flip-chip technology
In order to successfully partition a high performance large monolithic chip onto MCM-D/flip-chip-solder-bump technology, a number of key issues must be addressed. These include the following: (1) Partitioning a single clock-cycle path across the chip boundary within using; (2) Ability to use off-the-shelf memories; (3) Using the MCM for power, ground, and clock distribution; and (4) Managing test costs. This paper presents a discussion on these issues, using a CPU as an example, and speculates on some interesting possibilities arising from partitioning.
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