用于高质量应变InGaAsP MQW结构的窄条纹选择性MOVPE技术

Y. Sakata, K. Komatsu
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引用次数: 1

摘要

选择性MOVPE技术被广泛用于实现先进的光子集成器件。特别是窄带选择性(NS) MOVPE,它可以在小于2 /spl μ m /m宽的开放条带区域内工作,不仅可以实现面内带隙控制,而且可以直接形成波导,而无需任何半导体刻蚀过程。因此,NS-MOVPE是实现高度均匀器件特性的有力方法。然而,NS-MOVPE的生长机制非常复杂,因为在介质掩膜和半导体上都存在表面迁移效应。本文介绍了表面迁移效应研究的最新进展,为理解NS-MOVPE的机理提供了理论基础,并介绍了一种新型脉冲模式NS-MOVPE,用于实现应变InGaAsP MQW结构优异的晶体质量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Narrow-stripe selective MOVPE technology for high-quality strained InGaAsP MQW structures
Selective MOVPE technology is widely used for realizing advanced photonic integrated devices. Especially, narrow-stripe selective (NS) MOVPE which performs in less than 2 /spl mu/m-wide open-stripe region can achieve not only in-plane bandgap control but also direct waveguide formation without any semiconductor etching process. Therefore, NS-MOVPE is the powerful method for achieving highly uniform device characteristics. However, the growth mechanism of NS-MOVPE is very complicated due to the surface migration effect on both a dielectric mask and a semiconductor. This paper shows the recent progress in the study of the surface migration effect for understanding the mechanism of NS-MOVPE and introduce the novel pulse-mode NS-MOVPE for achieving an excellent crystal-quality of strained InGaAsP MQW structures.
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