{"title":"单片集成电路中衬底噪声的建模","authors":"G. Manetas, A. Cangellaris","doi":"10.1109/SMIC.2010.5422981","DOIUrl":null,"url":null,"abstract":"A convenient model is presented for the expedient calculation of semiconductor substrate-induced noise coupling under quasi-static conditions. The proposed model is motivated by the desire to provide for a quick means for predictive assessment of substrate noise levels with computational efficiency appropriate for noise-aware floor-planning and routing considerations early in the design phase. While computationally efficient, the quasi-static attributes of the model call for an assessment of the frequency range of its validity. To provide for this, a full-wave electrodynamic model is used to derive a quantity, termed dynamic factor, as a means to assess the accuracy of the quasi-static model versus frequency and substrate properties.","PeriodicalId":404957,"journal":{"name":"2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","volume":"53 7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Modeling of substrate noise in monolithic integrated circuits\",\"authors\":\"G. Manetas, A. Cangellaris\",\"doi\":\"10.1109/SMIC.2010.5422981\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A convenient model is presented for the expedient calculation of semiconductor substrate-induced noise coupling under quasi-static conditions. The proposed model is motivated by the desire to provide for a quick means for predictive assessment of substrate noise levels with computational efficiency appropriate for noise-aware floor-planning and routing considerations early in the design phase. While computationally efficient, the quasi-static attributes of the model call for an assessment of the frequency range of its validity. To provide for this, a full-wave electrodynamic model is used to derive a quantity, termed dynamic factor, as a means to assess the accuracy of the quasi-static model versus frequency and substrate properties.\",\"PeriodicalId\":404957,\"journal\":{\"name\":\"2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)\",\"volume\":\"53 7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMIC.2010.5422981\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMIC.2010.5422981","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling of substrate noise in monolithic integrated circuits
A convenient model is presented for the expedient calculation of semiconductor substrate-induced noise coupling under quasi-static conditions. The proposed model is motivated by the desire to provide for a quick means for predictive assessment of substrate noise levels with computational efficiency appropriate for noise-aware floor-planning and routing considerations early in the design phase. While computationally efficient, the quasi-static attributes of the model call for an assessment of the frequency range of its validity. To provide for this, a full-wave electrodynamic model is used to derive a quantity, termed dynamic factor, as a means to assess the accuracy of the quasi-static model versus frequency and substrate properties.