用掺铒Al2O3薄膜实现III-V集成光子

P. Jarschel, M. C. M. M. Souza, A. V. Von Zuben, A. C. Ramos, R. B. Merlo, N. Frateschi
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引用次数: 4

摘要

我们描述了掺铒Al2O3材料与980 nm发射的InGaAs/GaAs量子阱激光器的集成,证明了集成III-V基泵浦激光器和适合于光放大和平面光子学的材料的可能性。将掺铒材料与III-V化合物结合是具有挑战性的,因为离子活化通常需要高温退火。为了证明两种材料体系的相容性,我们采用掺铒Al2O3薄膜作为绝缘材料制备了激光样品。我们比较了退火(800°C)和未退火的器件,发现高温退火不影响激光器的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enabling III–V integrated photonics with Er-doped Al2O3 films
We describe the integration of erbium-doped Al2O3 material with InGaAs/GaAs quantum well lasers emitting at 980 nm, demonstrating the possibility of integrating III-V based pumping lasers and materials suitable for optical amplification and planar photonics. Combining Er-doped materials with III-V compounds is challenging since ion activation usually requires high temperature annealing. In order to demonstrate the compatibility of the two material systems we fabricated laser samples using Er-doped Al2O3 films as insulating material. We compare annealed (800°C) and non-annealed devices and show that laser performance is not affected by the high-temperature annealing.
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