硅纳米晶体在1550nm处的非线性特性及其在槽波导中的应用

2008 5th IEEE International Conference on Group IV Photonics Pub Date : 2008-10-07 DOI:10.1109/GROUP4.2008.4638160

R. Spano, L. Tartara, J. Yu, V. Degiorgio, E. Jordana, J. Fédéli, P. Sanchis, J. Marti, Lorenzo Pavesi

{"title":"硅纳米晶体在1550nm处的非线性特性及其在槽波导中的应用","authors":"R. Spano, L. Tartara, J. Yu, V. Degiorgio, E. Jordana, J. Fédéli, P. Sanchis, J. Marti, Lorenzo Pavesi","doi":"10.1109/GROUP4.2008.4638160","DOIUrl":null,"url":null,"abstract":"The nonlinear refractive index of Silicon nanocrystals was measured by the z-scan technique. The results were used to estimate the magnitude of the self-phase modulation (SPM) effect in slot waveguide structures filled by Silicon nanocrystals.","PeriodicalId":210345,"journal":{"name":"2008 5th IEEE International Conference on Group IV Photonics","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Nonlinear properties of Silicon nanocrystals at 1550 nm and their application in slot waveguides\",\"authors\":\"R. Spano, L. Tartara, J. Yu, V. Degiorgio, E. Jordana, J. Fédéli, P. Sanchis, J. Marti, Lorenzo Pavesi\",\"doi\":\"10.1109/GROUP4.2008.4638160\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The nonlinear refractive index of Silicon nanocrystals was measured by the z-scan technique. The results were used to estimate the magnitude of the self-phase modulation (SPM) effect in slot waveguide structures filled by Silicon nanocrystals.\",\"PeriodicalId\":210345,\"journal\":{\"name\":\"2008 5th IEEE International Conference on Group IV Photonics\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 5th IEEE International Conference on Group IV Photonics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GROUP4.2008.4638160\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 5th IEEE International Conference on Group IV Photonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GROUP4.2008.4638160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

采用z扫描技术测量了硅纳米晶体的非线性折射率。研究结果用于估计硅纳米晶体填充缝隙波导结构中自相位调制(SPM)效应的大小。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Nonlinear properties of Silicon nanocrystals at 1550 nm and their application in slot waveguides

The nonlinear refractive index of Silicon nanocrystals was measured by the z-scan technique. The results were used to estimate the magnitude of the self-phase modulation (SPM) effect in slot waveguide structures filled by Silicon nanocrystals.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2008 5th IEEE International Conference on Group IV Photonics

自引率

0.00%

发文量