一种新型低拉入电压高电容比射频MEMS开关

Chen-Yen Lai, Z. Deng, Yucheng Wang
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引用次数: 0

摘要

设计并分析了一种高电容比、低拉入电压的射频MEMS电容开关。该开关通过在介电层上添加h形的浮动金属层来改变开关的上下状态(通断状态)电容,在不改变开关材料和结构的情况下,显著提高了开关的电容比。通过弯曲弹簧梁,降低开关弹簧系数,降低开关的拉入电压。最后,通过理论分析和有限元仿真,得到的拉入电压为4.7 V。当开关工作在33ghz时,隔离度为−60db,插入损耗为−0.42 dB,电容比为301。该开关性能良好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Novel High Capacitance Ratio RF MEMS Switch with Low Pull-in Voltage
An RF MEMS capacitive switch, which has a high capacitance ratio and low pull-in voltage, is designed and analyzed in this paper. The switch can change the switch’s up and down state (on and off state) capacitance by adding an H-shaped floating metal layer on the dielectric layer, which dramatically improves the capacitance ratio of the switch without changing the switch’s material and structure. The switch’s pull-in voltage is reduced by bending the spring beam to lower the switch spring coefficient. Finally, through theoretical analysis and finite element simulation, the obtained pull-in voltage is 4.7 V. When the switch is working at 33 GHz, the isolation is −60 dB, the insertion loss is −0.42 dB, and the capacitance ratio is 301. The switch shows good performance.
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