O. Rinaudo, T. Zimmer, S. Limtouch, G. Bourgoin, P. Lalande
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SPICE data base for neutron (1 MeV) radiation hardening design: permanent damage effects simulation of bipolar transistors
This paper presents a methodology which predicts quite easily neutron irradiated SPICE model parameters for BJT's. This methodolgy is based on both the well-known neutron irradiation theory and the SPICE model. It has been demonstrated that the impact of neutron irradiation can be described through a modification of the unirradiated SPICE parameters without changing the intrinsic SPICE model.