采用(111)晶圆单面工艺制备的单片三轴悬臂式高冲击加速度计

H. Zou, Jiachou Wang, Fang Chen, Haifei Bao, Xinxin Li
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引用次数: 0

摘要

报道了单面制备的单片三轴压阻式高冲击加速度计。设计了一个单悬臂结构和两个双悬臂结构,分别用于检测z轴和X / y轴的高冲击加速度。悬臂的不同纵向尺寸可以通过(111)晶圆单面工艺实现并得到很好的控制。保持光滑的背面便于简单的后包装,无需芯片粘接。高冲击试验结果表明,X / y轴和z轴灵敏度分别为0.80 ~ 0.85 μV/g和1.36 μV/g。提出的单面工艺也有望制造其他具有不同纵向尺寸的复杂结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Monolithic tri-axis cantilever high-shock accelerometers fabricated with a single-sided process in (111) wafers
Single-sided fabricated monolithic tri-axis piezoresistive high-shock accelerometers are reported in this paper. A single-cantilever structure and two dual-cantilever structures are designed and employed to detect the Z-axis and X-/Y-axis high-shock accelerations, respectively. Different longitudinal dimensions of the cantilevers can be achieved and well controlled with a (111) wafer single-sided process. The remained smooth backside facilitates simple post-packaging without chip bonding. The results of the high shock test show the sensitivity of X-/Y-axis and Z-axis is 0.80–0.85 μV/g and 1.36 μV/g, respectively. The proposed single-sided process is also promising to fabricate other complex structures with different longitudinal sizes.
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