{"title":"一种用于实际电路的快速顺序学习技术,用于提高ATPG性能","authors":"A. El-Maleh, M. Kassab, J. Rajski","doi":"10.1145/277044.277206","DOIUrl":null,"url":null,"abstract":"This paper presents an efficient and novel method for sequential learning of implications, invalid states, and tied gates. It can handle real industrial circuits, with multiple clock domains and partial set/reset. The application of this method to improve the efficiency of sequential ATPG is also demonstrated by achieving higher fault coverages and lower test generation times.","PeriodicalId":221221,"journal":{"name":"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A fast sequential learning technique for real circuits with application to enhancing ATPG performance\",\"authors\":\"A. El-Maleh, M. Kassab, J. Rajski\",\"doi\":\"10.1145/277044.277206\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an efficient and novel method for sequential learning of implications, invalid states, and tied gates. It can handle real industrial circuits, with multiple clock domains and partial set/reset. The application of this method to improve the efficiency of sequential ATPG is also demonstrated by achieving higher fault coverages and lower test generation times.\",\"PeriodicalId\":221221,\"journal\":{\"name\":\"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/277044.277206\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/277044.277206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A fast sequential learning technique for real circuits with application to enhancing ATPG performance
This paper presents an efficient and novel method for sequential learning of implications, invalid states, and tied gates. It can handle real industrial circuits, with multiple clock domains and partial set/reset. The application of this method to improve the efficiency of sequential ATPG is also demonstrated by achieving higher fault coverages and lower test generation times.