U. Patel, Shashwat Sharma, Shunchuan Yang, S. Hum, P. Triverio
{"title":"使用曲面积分公式的三维互连的全波电磁特性","authors":"U. Patel, Shashwat Sharma, Shunchuan Yang, S. Hum, P. Triverio","doi":"10.1109/EPEPS.2017.8329738","DOIUrl":null,"url":null,"abstract":"This paper presents an accurate surface integral equation formulation for modeling interconnects. It accurately captures the skin effect inside conductors using a recently-developed 3D differential surface admittance operator. Numerical results demonstrate that the proposed formulation is significantly more efficient than existing volumetric techniques in terms of computational time and memory consumption.","PeriodicalId":397179,"journal":{"name":"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Full-wave electromagnetic characterization of 3D interconnects using a surface integral formulation\",\"authors\":\"U. Patel, Shashwat Sharma, Shunchuan Yang, S. Hum, P. Triverio\",\"doi\":\"10.1109/EPEPS.2017.8329738\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an accurate surface integral equation formulation for modeling interconnects. It accurately captures the skin effect inside conductors using a recently-developed 3D differential surface admittance operator. Numerical results demonstrate that the proposed formulation is significantly more efficient than existing volumetric techniques in terms of computational time and memory consumption.\",\"PeriodicalId\":397179,\"journal\":{\"name\":\"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2017.8329738\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2017.8329738","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Full-wave electromagnetic characterization of 3D interconnects using a surface integral formulation
This paper presents an accurate surface integral equation formulation for modeling interconnects. It accurately captures the skin effect inside conductors using a recently-developed 3D differential surface admittance operator. Numerical results demonstrate that the proposed formulation is significantly more efficient than existing volumetric techniques in terms of computational time and memory consumption.