应用优化自适应ECC与先进ldpc解决可靠性,性能和成本之间的权衡固态驱动器

Y. Yamaga, C. Matsui, Shogo Hachiya, K. Takeuchi
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引用次数: 3

摘要

基于NAND闪存的固态硬盘(ssd)的性能高度依赖于应用程序的读写特性[3],其中“强度”定义为读:写请求的比率,“写-热/冷”考虑写入频率。此外,NAND闪存的可靠性随着写/擦除(W/E)循环而降低。为了优化性能和可靠性,当页面错误率超过BCH的解码能力时,传统的纠错码(ECC)方案从快速的传统Bose-Chaudhuri- Hocquenghem (BCH)方案切换到较慢的传统低密度奇偶校验(LDPC)方案。然而,已经报道了先进的LDPC,称为Quick-LDPC[8]和没有(w/o)上/下单元的错误预测(EP-) LDPC[8],它们具有(i)比传统BCH更高的纠错能力和(ii)比传统软解码LDPC更短的解码时间。因此,本文提出了一种应用优化的自适应(AOA-) ECC,用于基于NAND闪存的企业级ssd。AOA-ECC包括一种新的算法,可以有效地结合两种先进的ldpc,考虑到应用程序的特点和内存的W/E周期。SSD系统中的固件根据应用是读/写密集型还是写/热/冷密集型来选择最优的高级LDPC。采用MLC NAND闪存的AOA-ECC固态硬盘,性能提高3倍,可靠性提高57%,ECC解码器面积减少25%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Application Optimized Adaptive ECC with Advanced LDPCs to Resolve Trade-Off among Reliability, Performance, and Cost of Solid-State Drives
The performance of NAND flash based solid-state drives (SSDs) is highly dependent on the application's read and write characteristics [3], where "intensity" is defined as ratio of read:write requests, and "write- hot/cold" considers the write frequency. Moreover, NAND flash memory's reliability degrades with write/erase (W/E) cycling. To optimize performance and reliability, conventional error-correcting code (ECC) scheme switches from fast conventional Bose-Chaudhuri- Hocquenghem (BCH) to slower conventional Low Density Parity Check (LDPC), when the page error rate exceeds BCH's decoding capability. However, advanced LDPCs have been reported, called Quick-LDPC [8] and Error- Prediction (EP-) LDPC without (w/o) upper/lower cells [8], which have (i) higher error correction capability compared to conventional BCH and (ii) shorter decoding time than conventional soft-decoding LDPC. Therefore, this paper proposes an application optimized adaptive (AOA-) ECC for Multi-Level-Cell (MLC) NAND flash-based enterprise SSDs. AOA-ECC includes a new algorithm to efficiently combine the two advanced LDPCs, considering the application's characteristics and memory's W/E cycles. A firmware in the proposed SSD system chooses the optimal advanced LDPC, based on whether the application is read/write-intensive and/or write- hot/cold. Using the proposed AOA-ECC SSD with MLC NAND flash, performance improves by up to 3-times, the reliability improves by 57% and the ECC decoder area decreases by 25%.
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