{"title":"VLSI中的功能故障测试","authors":"Y. Min, S. Su","doi":"10.1145/800263.809234","DOIUrl":null,"url":null,"abstract":"Functional testing has become increasingly important due to the advent of VLSI technology. This paper presents a systematic procedure for generating tests for detecting functional faults in digital systems described by the register transfer language. Procedures for testing register decoding, instruction decoding, data transfer, data storage and data manipulation function faults in microprocessors are described step-by-step. Examples are given to illustrate the procedures.","PeriodicalId":290739,"journal":{"name":"19th Design Automation Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":"{\"title\":\"Testing Functional Faults in VLSI\",\"authors\":\"Y. Min, S. Su\",\"doi\":\"10.1145/800263.809234\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Functional testing has become increasingly important due to the advent of VLSI technology. This paper presents a systematic procedure for generating tests for detecting functional faults in digital systems described by the register transfer language. Procedures for testing register decoding, instruction decoding, data transfer, data storage and data manipulation function faults in microprocessors are described step-by-step. Examples are given to illustrate the procedures.\",\"PeriodicalId\":290739,\"journal\":{\"name\":\"19th Design Automation Conference\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"26\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"19th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/800263.809234\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/800263.809234","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Functional testing has become increasingly important due to the advent of VLSI technology. This paper presents a systematic procedure for generating tests for detecting functional faults in digital systems described by the register transfer language. Procedures for testing register decoding, instruction decoding, data transfer, data storage and data manipulation function faults in microprocessors are described step-by-step. Examples are given to illustrate the procedures.
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