现场加速试验条件下故障率估计的贝叶斯方法

Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93) Pub Date : 1993-06-01 DOI:10.1109/ECTC.1993.346845

E. Gouno, G. Deleuze, M. Brizoux, C. Robert

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引用次数: 4

摘要

本文提出了一种基于贝叶斯统计的电子元器件可靠性分析方法。目的是通过加速试验的数据来估计使用条件下的故障率。模型中使用的先验密度已根据物理考虑和模拟建立。此外，这项工作还提供了加速因子的新形式

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Bayesian approach of failure rate estimation in field conditions through accelerated testing

This paper proposes a new approach of electronic components reliability using Bayesian statistics. The purpose is to estimate the failure rate in use conditions through data from accelerated tests. Priors densities used in the model has been built with physics considerations and simulations. Furthermore, this work provided new forms of accelerated factors.<>

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Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)

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