改进的液晶热点检测灵敏度

D. Burgess, P. Tan
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引用次数: 13

摘要

液晶在失效分析中的应用已经有好几年了。Hiatt利用胆甾液晶,证明了在偏振光下可以检测到热点,并且很容易拍摄到热点[1]。West为简单起见省略了偏振光,而是在失效器件上施加了5-20 Hz的方波脉冲,以便于对缺陷进行初步检测[2]。通过增加温度控制,Fleuren获得了很高的灵敏度,但常规复制他的成功所需的步骤尚不清楚[3]。本文介绍了一种新的加热方法,并对一种特殊的向列型液晶进行了详细的观察。该方法既灵敏又方便。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improved Sensitivity for Hot Spot Detection using Liquid Crystals
Liquid crystals have been used for various purposes in failure analysis for several years. Hiatt, using cholesteric liquid crystals, demonstrated that hot spots could be detected and readily photographed under polarized light [1]. West omitted the polarized light for simplicity, but applied a 5-20 Hz square wave pulse to the failing device to make initial detection of the defect easier [2]. Fleuren achieved great sensitivity by adding temperature control, but the steps required to routinely reproduce his success were not clear [3]. This paper introduces a new heating method and detailed observations for use of a particular nematic liquid crystal. The resulting technique is both sensitive and convenient.
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