单片机对电压脉冲串和单脉冲的灵敏度比较

2019 IEEE 31st International Conference on Microelectronics (MIEL) Pub Date : 2019-09-01 DOI:10.1109/MIEL.2019.8889638

A. Shemonaev, K. Epifantsev, P. Skorobogatov, A. Nikiforov

{"title":"单片机对电压脉冲串和单脉冲的灵敏度比较","authors":"A. Shemonaev, K. Epifantsev, P. Skorobogatov, A. Nikiforov","doi":"10.1109/MIEL.2019.8889638","DOIUrl":null,"url":null,"abstract":"The paper presents the results of ARM 32-bit Cortex-M0 and M4 CMOS microcontroller's sensitivity to a series of voltage pulses in comparison to a single pulse – all with damage subthreshold energy. The effect of pulses amount on the device voltage overstress threshold value was found and analyzed.","PeriodicalId":391606,"journal":{"name":"2019 IEEE 31st International Conference on Microelectronics (MIEL)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Microcontroller's Sensitivity to Voltage Pulse Series in Comparison with a Single Voltage Pulse\",\"authors\":\"A. Shemonaev, K. Epifantsev, P. Skorobogatov, A. Nikiforov\",\"doi\":\"10.1109/MIEL.2019.8889638\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents the results of ARM 32-bit Cortex-M0 and M4 CMOS microcontroller's sensitivity to a series of voltage pulses in comparison to a single pulse – all with damage subthreshold energy. The effect of pulses amount on the device voltage overstress threshold value was found and analyzed.\",\"PeriodicalId\":391606,\"journal\":{\"name\":\"2019 IEEE 31st International Conference on Microelectronics (MIEL)\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 31st International Conference on Microelectronics (MIEL)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIEL.2019.8889638\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 31st International Conference on Microelectronics (MIEL)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIEL.2019.8889638","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

本文介绍了ARM 32位Cortex-M0和M4 CMOS微控制器对一系列电压脉冲的灵敏度与单个脉冲的比较结果-所有脉冲都具有损伤亚阈值能量。发现并分析了脉冲量对器件电压过应力阈值的影响。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Microcontroller's Sensitivity to Voltage Pulse Series in Comparison with a Single Voltage Pulse

The paper presents the results of ARM 32-bit Cortex-M0 and M4 CMOS microcontroller's sensitivity to a series of voltage pulses in comparison to a single pulse – all with damage subthreshold energy. The effect of pulses amount on the device voltage overstress threshold value was found and analyzed.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2019 IEEE 31st International Conference on Microelectronics (MIEL)

自引率

0.00%

发文量