{"title":"评估基于sram的fpga的低成本鲁棒性改进","authors":"M. Jrad, R. Leveugle","doi":"10.1109/IOLTS.2013.6604072","DOIUrl":null,"url":null,"abstract":"Soft errors in the configuration memory of SRAM-based FPGAs cause significant application disturbances. We demonstrate on Xilinx and Altera FPGAs the feasibility of a very low cost and automated mitigation approach and we evaluate its efficiency.","PeriodicalId":423175,"journal":{"name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","volume":"130 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Evaluating a low cost robustness improvement in SRAM-based FPGAs\",\"authors\":\"M. Jrad, R. Leveugle\",\"doi\":\"10.1109/IOLTS.2013.6604072\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Soft errors in the configuration memory of SRAM-based FPGAs cause significant application disturbances. We demonstrate on Xilinx and Altera FPGAs the feasibility of a very low cost and automated mitigation approach and we evaluate its efficiency.\",\"PeriodicalId\":423175,\"journal\":{\"name\":\"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)\",\"volume\":\"130 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-07-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2013.6604072\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2013.6604072","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluating a low cost robustness improvement in SRAM-based FPGAs
Soft errors in the configuration memory of SRAM-based FPGAs cause significant application disturbances. We demonstrate on Xilinx and Altera FPGAs the feasibility of a very low cost and automated mitigation approach and we evaluate its efficiency.
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