{"title":"lfsr的功率特性","authors":"Marco Brazzarola, F. Fummi","doi":"10.1109/DFTVS.1999.802879","DOIUrl":null,"url":null,"abstract":"This paper presents a formal analysis on the power consumption of BIST architectures composed of primitive-polynomial LFSRs connected to a combinational CUT. An exact power characterization of all primitive-polynomial LFSRs has been identified, since interesting invariant properties have been discovered.","PeriodicalId":448322,"journal":{"name":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Power characterization of LFSRs\",\"authors\":\"Marco Brazzarola, F. Fummi\",\"doi\":\"10.1109/DFTVS.1999.802879\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a formal analysis on the power consumption of BIST architectures composed of primitive-polynomial LFSRs connected to a combinational CUT. An exact power characterization of all primitive-polynomial LFSRs has been identified, since interesting invariant properties have been discovered.\",\"PeriodicalId\":448322,\"journal\":{\"name\":\"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1999.802879\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1999.802879","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents a formal analysis on the power consumption of BIST architectures composed of primitive-polynomial LFSRs connected to a combinational CUT. An exact power characterization of all primitive-polynomial LFSRs has been identified, since interesting invariant properties have been discovered.