扫描可测电路的分层测试程序开发

J. Leenstra, L. Spaanenburg
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引用次数: 4

摘要

本文提出了一种新的扫描可测电路分层测试程序开发方法。我们将展示如何通过区分每个模型的内部和外部测试,逐步开发扫描设计的测试程序,与系统网表的分层结构一致。此外,通过引入测试汇编,这种分层测试程序开发方法也适用于需要专用测试程序的nwcross。因此,它提供了宏测试技术的一个有吸引力的增强。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Hierarchical Test Program Development for Scan Testable Circuits
In this paper a novel hierarchical test program development approach is presented for scan testable circuits. We will show how the test program for scan designs can be developed incrementally, in-line with the hierarchical construction ofthesystem netlist, by differentiating between interior and exlerior tests for each model. Furthermore, it will be shown that byintroducing test assembly, such an hierarchical test program development approach is also applicable when nwcros requiring dedicated test procedures are in use. Therefore itprovides an attractive enhancement of the Macro Testing technique.
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