{"title":"一种测量三端口y结AFSIW电路的测试夹具","authors":"Issam Marah, Antony Ghiotto, A. Verger, J. Pham","doi":"10.1109/IMWS-AMP53428.2021.9643855","DOIUrl":null,"url":null,"abstract":"This paper presents a test fixture for the measurement at both low- and high-power levels of 3-port Y-junction air-filled substrate integrated waveguide (AFSIW) components and circuits. The proposed test fixture is based on a rectangular waveguide (RWG) transition to AFSIW. A theoretical model of this transition is presented and validated from simulation results. An AFSIW Y-junction power divider operating in the 17.3 GHz to 21.2 GHz frequency range is introduced and used as a device under test (DUT). An experimental validation of the test fixture with the divider is achieved.","PeriodicalId":143802,"journal":{"name":"2021 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Test Fixture for the Measurement of 3-port Y-junction AFSIW Circuits\",\"authors\":\"Issam Marah, Antony Ghiotto, A. Verger, J. Pham\",\"doi\":\"10.1109/IMWS-AMP53428.2021.9643855\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a test fixture for the measurement at both low- and high-power levels of 3-port Y-junction air-filled substrate integrated waveguide (AFSIW) components and circuits. The proposed test fixture is based on a rectangular waveguide (RWG) transition to AFSIW. A theoretical model of this transition is presented and validated from simulation results. An AFSIW Y-junction power divider operating in the 17.3 GHz to 21.2 GHz frequency range is introduced and used as a device under test (DUT). An experimental validation of the test fixture with the divider is achieved.\",\"PeriodicalId\":143802,\"journal\":{\"name\":\"2021 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-11-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMWS-AMP53428.2021.9643855\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMWS-AMP53428.2021.9643855","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Test Fixture for the Measurement of 3-port Y-junction AFSIW Circuits
This paper presents a test fixture for the measurement at both low- and high-power levels of 3-port Y-junction air-filled substrate integrated waveguide (AFSIW) components and circuits. The proposed test fixture is based on a rectangular waveguide (RWG) transition to AFSIW. A theoretical model of this transition is presented and validated from simulation results. An AFSIW Y-junction power divider operating in the 17.3 GHz to 21.2 GHz frequency range is introduced and used as a device under test (DUT). An experimental validation of the test fixture with the divider is achieved.