{"title":"测试未来无线世界的挑战","authors":"Tapio Koivukangas","doi":"10.1109/TEST.2003.1271219","DOIUrl":null,"url":null,"abstract":"This environment is an undoubtedly very complex one containing devices from different product manufacturers (mobile terminals, base stations, wireless applications.. .). The amount of different kind of wireless applications will he huge. This is a big challenge also for testing e.g. how to locate the fault quickly, reliably and accurately and how to ensure interoperahility (IOP) between the devices already in R&D ohase before the actual Droduct launch.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Testing challenges of future wireless world\",\"authors\":\"Tapio Koivukangas\",\"doi\":\"10.1109/TEST.2003.1271219\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This environment is an undoubtedly very complex one containing devices from different product manufacturers (mobile terminals, base stations, wireless applications.. .). The amount of different kind of wireless applications will he huge. This is a big challenge also for testing e.g. how to locate the fault quickly, reliably and accurately and how to ensure interoperahility (IOP) between the devices already in R&D ohase before the actual Droduct launch.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1271219\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1271219","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This environment is an undoubtedly very complex one containing devices from different product manufacturers (mobile terminals, base stations, wireless applications.. .). The amount of different kind of wireless applications will he huge. This is a big challenge also for testing e.g. how to locate the fault quickly, reliably and accurately and how to ensure interoperahility (IOP) between the devices already in R&D ohase before the actual Droduct launch.