{"title":"格子波数字滤波器的低成本并发误差检测","authors":"R. Yousefi, M. Sargolzaie, S. M. Fakhraie","doi":"10.1109/ISTEL.2008.4651371","DOIUrl":null,"url":null,"abstract":"Wave digital filters are widely used in digital signal processing systems due to their implementation advantages such as low sensitivity, good round-off noise and wide dynamic range. A low-cost on-line test scheme for wave digital filters is proposed. Area overhead is reduced significantly with the aim to bring online testing to costumer electronics. 20% fault coverage improvement is also achieved by using the proposed simple test scheme.","PeriodicalId":133602,"journal":{"name":"2008 International Symposium on Telecommunications","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Low cost concurrent error detection for lattice wave digital filters\",\"authors\":\"R. Yousefi, M. Sargolzaie, S. M. Fakhraie\",\"doi\":\"10.1109/ISTEL.2008.4651371\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Wave digital filters are widely used in digital signal processing systems due to their implementation advantages such as low sensitivity, good round-off noise and wide dynamic range. A low-cost on-line test scheme for wave digital filters is proposed. Area overhead is reduced significantly with the aim to bring online testing to costumer electronics. 20% fault coverage improvement is also achieved by using the proposed simple test scheme.\",\"PeriodicalId\":133602,\"journal\":{\"name\":\"2008 International Symposium on Telecommunications\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Symposium on Telecommunications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISTEL.2008.4651371\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on Telecommunications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISTEL.2008.4651371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low cost concurrent error detection for lattice wave digital filters
Wave digital filters are widely used in digital signal processing systems due to their implementation advantages such as low sensitivity, good round-off noise and wide dynamic range. A low-cost on-line test scheme for wave digital filters is proposed. Area overhead is reduced significantly with the aim to bring online testing to costumer electronics. 20% fault coverage improvement is also achieved by using the proposed simple test scheme.