{"title":"FPGA中扰流特性及考虑因素","authors":"Christian Johansson, T. Manefjord","doi":"10.1109/NORCHIP.2018.8573506","DOIUrl":null,"url":null,"abstract":"The increase in performance and the relatively low cost have made the FPGA an attractive technology for use in various product areas. When used in safety-critical applications, the susceptibility against upsets due to cosmic radiation requires special considerations. In this paper, a number of mitigation techniques against upsets are discussed together with the use of a COTS IP. Furthermore, practical tests are performed to validate the upset rates and mitigation techniques. The tests are performed on a Xilinx UltraScale+MPSOC FPGA.","PeriodicalId":152077,"journal":{"name":"2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Characterization and Considerations for Upset in FPGA\",\"authors\":\"Christian Johansson, T. Manefjord\",\"doi\":\"10.1109/NORCHIP.2018.8573506\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The increase in performance and the relatively low cost have made the FPGA an attractive technology for use in various product areas. When used in safety-critical applications, the susceptibility against upsets due to cosmic radiation requires special considerations. In this paper, a number of mitigation techniques against upsets are discussed together with the use of a COTS IP. Furthermore, practical tests are performed to validate the upset rates and mitigation techniques. The tests are performed on a Xilinx UltraScale+MPSOC FPGA.\",\"PeriodicalId\":152077,\"journal\":{\"name\":\"2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NORCHIP.2018.8573506\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NORCHIP.2018.8573506","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterization and Considerations for Upset in FPGA
The increase in performance and the relatively low cost have made the FPGA an attractive technology for use in various product areas. When used in safety-critical applications, the susceptibility against upsets due to cosmic radiation requires special considerations. In this paper, a number of mitigation techniques against upsets are discussed together with the use of a COTS IP. Furthermore, practical tests are performed to validate the upset rates and mitigation techniques. The tests are performed on a Xilinx UltraScale+MPSOC FPGA.