{"title":"电力电子构件用金属柱互联平行板结构的评价","authors":"Kalyan Siddabattula, Zhou Chen, D. Boroyevich","doi":"10.1109/APEC.2000.826115","DOIUrl":null,"url":null,"abstract":"This paper evaluates metal post interconnected parallel plate structure (MPIPPS) adopted for the power electronic building blocks (PEBB) packaging program in terms of parasitic elements involved in the layout design, current distribution and its impact on electrical performance. It also compares this technology with the more conventional wire-bond technology. Electrical performance predicted by INCA, Maxwell, and PSPICE is verified with an experimental setup.","PeriodicalId":347959,"journal":{"name":"APEC 2000. Fifteenth Annual IEEE Applied Power Electronics Conference and Exposition (Cat. No.00CH37058)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Evaluation of metal post interconnected parallel plate structure for power electronic building blocks\",\"authors\":\"Kalyan Siddabattula, Zhou Chen, D. Boroyevich\",\"doi\":\"10.1109/APEC.2000.826115\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper evaluates metal post interconnected parallel plate structure (MPIPPS) adopted for the power electronic building blocks (PEBB) packaging program in terms of parasitic elements involved in the layout design, current distribution and its impact on electrical performance. It also compares this technology with the more conventional wire-bond technology. Electrical performance predicted by INCA, Maxwell, and PSPICE is verified with an experimental setup.\",\"PeriodicalId\":347959,\"journal\":{\"name\":\"APEC 2000. Fifteenth Annual IEEE Applied Power Electronics Conference and Exposition (Cat. No.00CH37058)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-02-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"APEC 2000. Fifteenth Annual IEEE Applied Power Electronics Conference and Exposition (Cat. No.00CH37058)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEC.2000.826115\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"APEC 2000. Fifteenth Annual IEEE Applied Power Electronics Conference and Exposition (Cat. No.00CH37058)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEC.2000.826115","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluation of metal post interconnected parallel plate structure for power electronic building blocks
This paper evaluates metal post interconnected parallel plate structure (MPIPPS) adopted for the power electronic building blocks (PEBB) packaging program in terms of parasitic elements involved in the layout design, current distribution and its impact on electrical performance. It also compares this technology with the more conventional wire-bond technology. Electrical performance predicted by INCA, Maxwell, and PSPICE is verified with an experimental setup.