{"title":"同步顺序电路的高效并发故障仿真","authors":"Dong-Ho Lee, S. Reddy","doi":"10.1109/DAC.1992.227784","DOIUrl":null,"url":null,"abstract":"The authors report on an efficient fault simulation method for synchronous sequential circuits. The method is based on concurrent fault simulation and has the simplicity of deductive fault simulation. Several new ideas to reduce computation time and memory requirements are proposed. New fault simulators were developed to simulate transition faults as well as stuck-at faults. The experimental results demonstrate that the proposed method is effective for simulating faults in large synchronous sequential circuits in the workstation environment.<<ETX>>","PeriodicalId":162648,"journal":{"name":"[1992] Proceedings 29th ACM/IEEE Design Automation Conference","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"On efficient concurrent fault simulation for synchronous sequential circuits\",\"authors\":\"Dong-Ho Lee, S. Reddy\",\"doi\":\"10.1109/DAC.1992.227784\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors report on an efficient fault simulation method for synchronous sequential circuits. The method is based on concurrent fault simulation and has the simplicity of deductive fault simulation. Several new ideas to reduce computation time and memory requirements are proposed. New fault simulators were developed to simulate transition faults as well as stuck-at faults. The experimental results demonstrate that the proposed method is effective for simulating faults in large synchronous sequential circuits in the workstation environment.<<ETX>>\",\"PeriodicalId\":162648,\"journal\":{\"name\":\"[1992] Proceedings 29th ACM/IEEE Design Automation Conference\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1992] Proceedings 29th ACM/IEEE Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1992.227784\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1992] Proceedings 29th ACM/IEEE Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1992.227784","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On efficient concurrent fault simulation for synchronous sequential circuits
The authors report on an efficient fault simulation method for synchronous sequential circuits. The method is based on concurrent fault simulation and has the simplicity of deductive fault simulation. Several new ideas to reduce computation time and memory requirements are proposed. New fault simulators were developed to simulate transition faults as well as stuck-at faults. The experimental results demonstrate that the proposed method is effective for simulating faults in large synchronous sequential circuits in the workstation environment.<>