{"title":"双V/sub / T/技术下深亚微米CMOS电路的静态功率优化","authors":"Qi Wang, S. Vrudhula","doi":"10.1145/288548.289076","DOIUrl":null,"url":null,"abstract":"We address the problem of delay constrained minimization of leakage power of CMOS digital circuits for dual V/sub T/ technology. A novel and efficient heuristic alogrithm based on circuit graph enumeration is proposed. The experimental results on the MCNC91 benchmark circuits show that up to an order of magnitude power reduction can be achieved without any increase in delay.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"109","resultStr":"{\"title\":\"Static power optimization of deep submicron CMOS circuits for dual V/sub T/ technology\",\"authors\":\"Qi Wang, S. Vrudhula\",\"doi\":\"10.1145/288548.289076\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We address the problem of delay constrained minimization of leakage power of CMOS digital circuits for dual V/sub T/ technology. A novel and efficient heuristic alogrithm based on circuit graph enumeration is proposed. The experimental results on the MCNC91 benchmark circuits show that up to an order of magnitude power reduction can be achieved without any increase in delay.\",\"PeriodicalId\":224802,\"journal\":{\"name\":\"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"109\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/288548.289076\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/288548.289076","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Static power optimization of deep submicron CMOS circuits for dual V/sub T/ technology
We address the problem of delay constrained minimization of leakage power of CMOS digital circuits for dual V/sub T/ technology. A novel and efficient heuristic alogrithm based on circuit graph enumeration is proposed. The experimental results on the MCNC91 benchmark circuits show that up to an order of magnitude power reduction can be achieved without any increase in delay.