关于腔体系统生产误差对磁控管参数再现的影响

2000 10th International Crimean Microwave Conference. "Microwave and Telecommunication Technology". Conference Proceedings (IEEE Cat. No.00EX415) Pub Date : 2000-09-11 DOI:10.1109/CRMICO.2000.1255906

A. A. Gurko, F.R. Sayevskiy, V. Yeremka

{"title":"关于腔体系统生产误差对磁控管参数再现的影响","authors":"A. A. Gurko, F.R. Sayevskiy, V. Yeremka","doi":"10.1109/CRMICO.2000.1255906","DOIUrl":null,"url":null,"abstract":"The difficulties in stabilization of magnetron parameters sharply increase with the operating wave length decreasing. The real magnetron resonator system of a millimeter band is not possible to be considered as a uniform system because of processing non-uniformities influence. This work is aimed to develop methods for calculated estimation of the influence of resonator system production errors on the reproduction of magnetron parameters.","PeriodicalId":387003,"journal":{"name":"2000 10th International Crimean Microwave Conference. \"Microwave and Telecommunication Technology\". Conference Proceedings (IEEE Cat. No.00EX415)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"About influence of the cavity system production errors on reproduction of magnetron parameters\",\"authors\":\"A. A. Gurko, F.R. Sayevskiy, V. Yeremka\",\"doi\":\"10.1109/CRMICO.2000.1255906\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The difficulties in stabilization of magnetron parameters sharply increase with the operating wave length decreasing. The real magnetron resonator system of a millimeter band is not possible to be considered as a uniform system because of processing non-uniformities influence. This work is aimed to develop methods for calculated estimation of the influence of resonator system production errors on the reproduction of magnetron parameters.\",\"PeriodicalId\":387003,\"journal\":{\"name\":\"2000 10th International Crimean Microwave Conference. \\\"Microwave and Telecommunication Technology\\\". Conference Proceedings (IEEE Cat. No.00EX415)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 10th International Crimean Microwave Conference. \\\"Microwave and Telecommunication Technology\\\". Conference Proceedings (IEEE Cat. No.00EX415)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.2000.1255906\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 10th International Crimean Microwave Conference. \"Microwave and Telecommunication Technology\". Conference Proceedings (IEEE Cat. No.00EX415)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2000.1255906","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

磁控管参数稳定的难度随着工作波长的减小而急剧增加。由于加工不均匀性的影响，实际的毫米波段磁控管谐振器系统不可能被认为是均匀系统。本工作旨在发展计算估计谐振器系统生产误差对磁控管参数再现影响的方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

About influence of the cavity system production errors on reproduction of magnetron parameters

The difficulties in stabilization of magnetron parameters sharply increase with the operating wave length decreasing. The real magnetron resonator system of a millimeter band is not possible to be considered as a uniform system because of processing non-uniformities influence. This work is aimed to develop methods for calculated estimation of the influence of resonator system production errors on the reproduction of magnetron parameters.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2000 10th International Crimean Microwave Conference. "Microwave and Telecommunication Technology". Conference Proceedings (IEEE Cat. No.00EX415)

自引率

0.00%

发文量