用天然双棱镜干涉条纹评价电子源的有限横向相干长度

IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) Pub Date : 2003-07-07 DOI:10.1109/IVMC.2003.1223006

A. Yajima, W. Kobayashi, T. Ichimura, B. Cho, C. Oshima

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引用次数: 0

摘要

多壁碳纳米管(MWCNT)可以在投影显微镜(PM)中发挥双棱镜干涉仪的作用。通过对双棱镜干涉图的分析，得到了有效源尺寸、横向相干宽度等信息。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism

In this paper, multi-walled carbon nanotubes (MWCNT) can play the role of biprism interferometer in projection microscopy (PM). The biprism interference patterns are analyzed in order to obtain information on the properties of the source, such as the effective source size, the transverse coherence width.

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IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479)

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