IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479)

IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479)
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IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - 最新文献

Competition of nitrogen doping and graphitization effect for field electron emission from nanocrystalline diamond films

Pub Date : 2004-06-03 DOI: 10.1109/IVMC.2003.1222983 A. Karabutov, V. Konov, V. V. Pereverzev, I. Vlasov, E. Zavedeev, S. Pimenov, E. N. Loubnin

The growth of aligned Cu/sub 2/S nanowire arrays with AAO template by gas-solid reaction

Pub Date : 2003-08-26 DOI: 10.1109/IVMC.2003.1223051 Q.B. Wu, S. Ren, S. Deng, Jun Chen, N. Xu

Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism

Pub Date : 2003-07-07 DOI: 10.1109/IVMC.2003.1223006 A. Yajima, W. Kobayashi, T. Ichimura, B. Cho, C. Oshima
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