{"title":"小传输批大小的周期时间透视","authors":"D. Wright, T. Chang","doi":"10.1109/ASMC.2006.1638775","DOIUrl":null,"url":null,"abstract":"This paper discusses advantages and disadvantages of smaller transfer batch size in an automated semiconductor factory. A framework is suggested by which the \"theoretical\" cycle time is determined from the point-of-view of the wafer, not the lot. Using this framework, we then look at the possible application of a \"virtual cluster tool\" by identifying requirements on the process times and transport system. Benefits and risks are then discussed for the approach, using a simple example","PeriodicalId":407645,"journal":{"name":"The 17th Annual SEMI/IEEE ASMC 2006 Conference","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Cycle Time Perspectives for Small Transfer Batch Size\",\"authors\":\"D. Wright, T. Chang\",\"doi\":\"10.1109/ASMC.2006.1638775\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses advantages and disadvantages of smaller transfer batch size in an automated semiconductor factory. A framework is suggested by which the \\\"theoretical\\\" cycle time is determined from the point-of-view of the wafer, not the lot. Using this framework, we then look at the possible application of a \\\"virtual cluster tool\\\" by identifying requirements on the process times and transport system. Benefits and risks are then discussed for the approach, using a simple example\",\"PeriodicalId\":407645,\"journal\":{\"name\":\"The 17th Annual SEMI/IEEE ASMC 2006 Conference\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 17th Annual SEMI/IEEE ASMC 2006 Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.2006.1638775\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 17th Annual SEMI/IEEE ASMC 2006 Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.2006.1638775","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Cycle Time Perspectives for Small Transfer Batch Size
This paper discusses advantages and disadvantages of smaller transfer batch size in an automated semiconductor factory. A framework is suggested by which the "theoretical" cycle time is determined from the point-of-view of the wafer, not the lot. Using this framework, we then look at the possible application of a "virtual cluster tool" by identifying requirements on the process times and transport system. Benefits and risks are then discussed for the approach, using a simple example