基于实物系统的高性能车载计算机热力可靠性研究

R. Dudek, R. Döring, S. Rzepka, P. Gromala, Jens Schindele, B. Vandevelde
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引用次数: 2

摘要

为了实现自动驾驶而使用电子设备,需要在恶劣环境下使用高性能车载计算机(HPVC)系统。必须从不同的角度考虑各种具有挑战性的问题。本文主要从可靠性和功能安全的角度进行研究。为了物理模拟和分析实际处理器在不同工作模式下的热学和热力学行为,设计了一个模型系统,并通过虚拟手段对其进行了初步建模。热机械设计方法基本上是基于有限元参数研究,使用一个完整的模型,包括第一级和第二级互连,以及包括焊料蠕变和其他材料非线性。为了全面了解材料参数选择的总体影响,首先进行了虚拟DOE。模型的复杂性和尺寸限制了虚拟DOE的实现,通过简化几何细节和弹性材料建模来实现。材料模型的比较包括SAC305的粘塑性模型和聚合物的粘弹性模型。实现高t周可靠性是样机系统面临的一大挑战。对一级互连和二级互连的影响进行了分析。结果表明,一级碰撞疲劳或下填料1层脱层是最高的失效风险,这主要受装配工艺选择的影响,即下填料/下模和焊罩的选择。模拟固有的问题,如使用联合的次级/初级蠕变模型与阿南德模型进行比较,并观察到良好的一致性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Studies on Thermo-Mechanical Reliability of High Performance Vehicle Computers Based on a Mock-up System
The use of electronics for purpose of autonomous driving requires high performance vehicle computer (HPVC) systems usable in harsh environments. A variety of challenging issues have to be considered from different perspectives. The paper focuses on the perspective of reliability and functional safety. To physically simulate and to analyze the thermal and the thermo-mechanical behaviors of the actual processors in different operation modes, a mockup system is designed, which has initially been modelled by virtual means. The thermo-mechanical design methodology is essentially based on FE parametric studies, using a full model including 1st and 2nd level interconnects as well as including solder creep and other materials non-linearity.. To gain an overview on overall influences of materials parameters choice, virtual DOE was made at the beginning. Model complexity and size limits virtual DOE, which was performed with reduced geometric details and elastic material modeling. Comparison on material models comprise visco-plastic models for SAC305 and visco-elastic models for polymers. To reach high T-cycle reliability is a challenge for the mock-up system. The effects were analyzed for both first level and second level interconnects. It is shown that first level bumps fatigue or underfill 1 delamination are highest failure risks, which can be basically affected by choice of the assembly technology, i.e. underfill/undermold and soldermask choices. Simulation inherent issued like the use of a combined secondary/primary creep model vs. an Anand’s model are compared and good agreement has been observed.
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