双极a /D转换器的剂量率效应

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1996-07-19 DOI:10.1109/REDW.1996.574186

G. Youk

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引用次数: 5

摘要

AD574模数转换器在2 ~ 10 rad(Si)/秒的剂量率下，在41/spl℃的工作温度下进行了总电离剂量率测试。AD574由Analog Devices采用Bipolar II技术制造。将结果与之前其他人的结果进行比较，以了解趋势。结果表明，随着剂量率的增加，故障率逐渐增加。与室温下的离线测试结果不同，AD574器件在高温下的原位测试没有发现低剂量率下的降解迹象。观察到辐照退火后20分钟内故障快速恢复。这种恢复自动排除了接口trap积聚作为主要故障机制的可能性。大块氧化物电荷的贡献似乎是一个主要因素。

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Dose rate effects of a bipolar A/D converter

Total ionizing dose-rate tests of an AD574 analog-to-digital converter were performed at dose rates of 2 to 10 rad(Si)/sec at an operating temperature (41/spl deg/C). The AD574 has been manufactured by Analog Devices using Bipolar II technology. Results were compared with previous results from others to see trends. The results show increasing failure rate as dose rate increases. Unlike off-line test results at room temperature, no sign of degradation at low dose rates was found from the in-situ tests of AD574 devices at elevated temperature. Fast recovery of failure within 20 minutes post-irradiation annealing was observed. This recovery automatically rules out an interface-trap buildup as a dominant failure mechanism. The contribution of bulk-oxide charges seems to be a major factor.

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来源期刊

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference

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