一个商业扇出缓冲器、一个可变增益放大器和一个±40V运算放大器的质子测试结果

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI:10.1109/RADECS.2017.8696121

R. Milanowski, Slaven Moro, N. Hall, Raichelle J. Aniceto, B. Vermeire, Neal Nicholson

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引用次数: 0

摘要

我们提供了三个商业模拟集成电路的质子辐射测试结果，这些电路没有太空合格的等效电路。结果表明，该组件适用于某些空间应用。建议对增强的低剂量率灵敏度和单事件闭锁进行额外的测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proton Test Results for a Commercial Fanout Buffer, a Variable Gain Amplifier, and a ±40V Operational Amplifier

We provide proton radiation test results for three commercial analog integrated circuits that have no space-qualified equivalents. Results suggest the components are suitable for some space applications. Additional testing for Enhanced Low Dose Rate Sensitivity and Single Event Latchup is recommended.

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来源期刊

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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